Attribute chart: c chart is also known as the control chart for defects is generally used to monitor the number of defects in constant size.
Attribute chart: u chart is the control chart for defects per unit. It is used to monitor the count type of data where the sample size is>1.
Attribute chart: np chart is generally used to monitor the number of non-conforming or defective items in the measurement process.
Attribute Charts: p Chart is generally used to analyze the proportions of defective or non-confirming items in a process.
Attribute charts display information on defects and defectives. They help you visualize the enemy – variation!